Our platform combines expertise in the field of molecular identification and surface chemistry, with two state-of-the-art machines: a PHI nanoTOF II TOF-SIMS mass spectrometer with parallel MS/MS imaging and a PHI VersaProbe III scanning XPS microprobe.
Both academic and industrial laboratories will be able to take advantage of what this equipment has to offer, and the scientific know-how of this platform, to meet their technological challenges in a wide range of fields of activity.
These two complementary techniques allow, among other things, a quantitative analysis of elements and molecules. They represent a real asset for research, and support for innovation, at a regional and national level.
Come and discover the potential of this new platform, which is unique in Switzerland. During this seminar, experts will be available to discuss the potential of the XPS and TOF-SIMS techniques in your field of activity, and to answer your questions. A personalised meeting to discuss your projects, including a visit to the laboratory, can be arranged at your convenience.
Source – www.lta-geneva.ch
| WHEN | Thursday 14 november 2019 10:30 |
| WHERE | École de physique, Grand auditoire Quai Ernest-Ansermet 24 1205 Geneva |
| INFO & REGISTRATION | HERE |
| FULL PROGRAM | HERE |
| ORGANIZERS | LTA |